The structure and microstructure of BaTiO3 nanoparticles synthesized by polymeric precursor method are correlated with the mean crystallite size and tetragonality ratio, c/a. Williamson-Hall integral breadth method is used for evaluation of microstructural quantities like, mean crystallite size and microstrain, etc. The structural evolution and the related change in properties with respect to the used method in this paper and other reported methods are tried to correlate with the tetragonality ratio, c/a. The structure of the synthesized nanoparticles is characterized with XRD, SEM, TEM and EDX analysis. Microstructural parameters of BaTiO3 nanoparticles are measured with the XRD line profile analysis.
Barium
titanate (BaTiO3) is a versatile electroceramic
that finds widespread applications in making electronic devices
such as Multilayer Ceramic Capacitors (MLCCs), self-controlled
heaters, communication filters and piezoelectric sensors [1-5].
One of the important properties of BaTiO3 is permittivity.
Even though BaTiO3 ceramics usually display high
permittivities of more than 1000 at room temperature, there
may be a strongly dependence on chemical and microstructural
variations [4]. For example, Buessem et al. [6] explained
the high permittivity in fine-grained BaTiO3 ceramics
in terms of an internal stress below the Curie temperature
(Tc). The `grain size effect on permittivity',
has been one of the most important subjects in BaTiO3 ceramics. In addition to these reports, there are a few studies
showing the change in dielectric properties of BaTiO3 ceramics as a result of microstructural evolution of BaTiO3 ceramics [4, 7]. Although, the bulk properties of BaTiO3 ceramics have been widely investigated in the past, more recently,
there has been a renewal of interest in nanoscale particles
of BaTiO3 because its electrical properties are
strongly dependent upon the grain size and the crystalline
structure [4]. High dielectric constant BaTiO3 ceramics, with ultra-fine grains, are the need of the hour
in order to obtain a thinner dielectric layer [8-10]. |